Agilent B1506A, Keysight B1506A, HP B1506A
Power Device Analyzer - Curve Tracer

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RENT KEYSIGHT B1506A

The Keysight B1506A Power Device Analyzer for Circuit Design is a comprehensive test solution that can assist power electronic circuit designers maximize the value of their power electronics products by enabling them to select the correct power semiconductor devices and components for their applications. It can evaluate all relevant device parameters under a wide range of operating conditions, including  IV parameters such as breakdown voltage and on-resistance, as well as three terminal FET capacitances, gate charge and power loss.

The B1506A has a wide range of capabilities that help it identify substandard semiconductor devices and components under actual circuit operating conditions, including a wide voltage and current range (3 kV and 1500 A), a wide temperature measurement range (-50 to +250 °C), fast pulsing capability,and sub-nA level current measurement capability. Its unique software interface , Easy Test Navigator, presents the user with a familiar device data sheet format that makes it easy to characterize semi-conductor devices and components without going through any formal training. Integrated switching circuitry within the test fixture supports fully automated testing, with the ability to automatically change between both high voltage and high current testing as well as between IV and CV measurements. In addition, a unique plug-in style device test fixture socket adapter eliminates cable connection and other human-related errors. The B1506A also supports the complete automation of thermal characterization. This can be accomplished through the integrated Thermostream control. Since the DUT is in close proximity to the B1506A’s measurement resources, the large parasitics caused by cable extensions leading to a temperature chamber do not exist. For this reason, oscillation free ultra-high currents of up to 1500 A can be accurately evaluated at both low and high temperature.

• Measures all IV parameters (Ron, BV, Leakage, Vth, Vsat, etc.)
• Measure transistor input, output and reverse transfer capacitances (Ciss, Coss, Crss, Cies, Coes, Cres, Rg) at high bias voltages
• Qg curve measurement for Nch MOSFETs and IGBTs
• Power loss (conduction, driving and switching) evaluation
• Menu driven user interface specially designed for circuit designers (Easy Test Navigator - ETN)–Quick and automatic device datasheet generation
• Data sheet characterization mode supports quick and easy evaluations of data sheet parameters
• Wide operation I/V (1500A, 3kV)Thermal test (−50 to +250 °C)–
• Oscilloscope View provides visual verification of pulsed measurement waveforms
• Covers typical semiconductor devices and electronic components used in high power circuits

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