RENT MICROSEMI 53100A Phase Noise and Allan Deviation Tester (Call for Availability)
The Microsemi 53100A Phase Noise Analyzer measures the amplitude, phase and frequency stability of high-performance RF sources. Carrier frequencies from 1 MHz to 200 MHz are supported. The 53100A tells you everything you need to know about the stability characteristics of your devices, at timescales ranging from femtoseconds to days. From use on a bench-top or embedded into rack-mount ATE systems, the small formfactor and industry-leading measurement speed makes this test set versatile for multiple applications. Thanks to an improved design and advancements in manufacturing, the 53100A offers improvements in reliability and performance over its predecessor technologies.
Expanding upon the heritage of the 3120A and 51XXA series of instruments, the Microsemi 53100A makes fast yet accurate single side band (SSB) phase noise and Allan deviation (ADEV) measurements at a fraction of the cost of alternate solutions. Using high performance host-based DSP techniques on a Windows® PC, all of these measurements can be made simultaneously. Results appear as you watch – and you can save, view, compare, or print them at any time with a variety of export options including TSC 51XXA compatibility. Accuracy and stability are inherited from a user-supplied external reference which can run at any frequency within the supported range, with no calibration required by the instrument itself.
Specifications for the MICROSEMI 53100A Phase Noise and Allan Deviation Tester Include:
|Frequency Range||1 to 200 MHz|
|Offset Frequency Range||0.001 Hz to 1 MHz|
|Input Signal Level||–5 to +15 dBm|
See Datasheet for full specifications
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