InformationYokogawa AQ6375 Optical Spectrum Analyzer, 1200 nm to 2400 nm, +20 dBm to -70 dBm
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The Yokogawa AQ6375 Optical Spectrum Analyzer is the first bench-top optical spectrum analyzer covering the long wavelengths over 2 µm.
It is designed for researchers and engineers who have been struggling with inadequate test equipment to measure in these long wavelength ranges. The Yokogawa AQ6375 Optical Spectrum Analyzer achieves high speed measurements with high accuracy, resolution and sensitivity, even while providing full analysis features. Troublesome calibration steps and the development of external analysis software is no longer required.
Features and Specifications of the Yokogawa AQ6375 Optical Spectrum Analyzer include:
The Yokogawa AQ6375 Optical Spectrum Analyzer is the first bench-top optical spectrum analyzer covering the long wavelengths over 2 µm.
It is designed for researchers and engineers who have been struggling with inadequate test equipment to measure in these long wavelength ranges. The Yokogawa AQ6375 Optical Spectrum Analyzer achieves high speed measurements with high accuracy, resolution and sensitivity, even while providing full analysis features. Troublesome calibration steps and the development of external analysis software is no longer required.
Features and Specifications of the Yokogawa AQ6375 Optical Spectrum Analyzer include:
- High Performance:
- Long Wavelength Measurement Capability
- High Wavelength Accuracy & Resolution
- High Sensitivity
- High Speed Measurement
- USB for Mouse, Keyboard, and Memory
- Remote Operation (GPIB, RS-232, Ethernet)
- Applications:
- Optical Fiber Communications
- Laser and Optical Device Test
- For Gas Sensing
- Medical
- Free-Space Communications
- For Gas Sensing
- Passive Optical Devices
- Long Wavelength: 1200 nm to 2400 nm
- Covers telecommunication wavelengths
- Covers long wavelengths used for:
- Environmental Sensing
- Medical
- Industrial Material Applications
- High Sensitivity: +20 dBm to -70 dBm
- Measures Optical Power as low as -70 dBm enabling measurements of low power sources or low power output of a device under test
- Measurement Sensitivity can be chosen from 7 categories according to test applications and measurement speed requirements
- High Resolution & Wide Dynamic Range:
- Double-Pass Monochromator Structure achieves:
- High Wavelength Resolution (0.05 nm)
- Wide Close-In Dynamic Range (55dB)
- Closely Allocated Signals and Noise can be measured separately
- Double-Pass Monochromator Structure achieves:
- High Speed Measurement and Greater Efficiency:
- High Speed Sweep:
- Proprietary sweep technique helps achieve a much faster sweep speed than conventional measurement systems
- Max sweep time is only 0.5 sec. in 100 nm span
- Proprietary sweep technique helps achieve a much faster sweep speed than conventional measurement systems
- Fast Command Processing and Data Transfer:
- Fast Microprocessor helps achieve a very fast command processing speed
- Ethernet provides up to 100 times faster data transfer speed than the GP-IB
- High Speed Sweep:
- Free-Space Optical Input Structure:
- Supports Multimode Fiber
- Applicable Fiber: SMF and MMF
- Beneficial for measurement repeatability
- Built-In Calibrator:
- Wavelength calibration and optical alignment adjustment of the monochromator helps maintain accurate measurements
- Calibration and adjustment automatically performed within minutes
- Wavelength can be calibrated with the designate absorption line of Acetylene gas or with an external light source
- Optical Alignment Adjustment corrects mechanical movements inside the monochromator caused by shock and vibration
