Keithley 2502 Picoammeter, 2 Ch.

The Keithley 2502 Dual-Channel Picoammeter provides two independent picoammeter-voltage source channels for a wide range of low level measurement applications including laser diode testing. It is also designed to increase the throughput of Keithley's LIV (lightcurrent- voltage) test system for production testing of laser diode modules (LDMs). Developed in close cooperation with leading manufacturers of LDMs for fiberoptic telecommunication networks, this dual-channel instrument has features that make it easy to synchronize with other system elements for tight control over optical power measurements.

The Keithley 2502 Picoammeter features a high speed analog output that allows using the LIV test system at the fiber alignment stage of the LDM manufacturing process. Through the use of buffer memory and a Trigger Link interface that's unique to Keithley instruments, the Keithley 2502 Picoammetercan offer the fastest throughput available today for LIV testing of laser diode modules. These instruments are ruggedly engineered to meet the reliability and repeatability demands of continuous operation in round-the-clock production environments.

Features and Specifications of the Keithley 2502 Picoammeter include:

• Fiber Alignment Photodiode Meter with Voltage Source
• Dual-channel instrument for:
  • optical power measurements
  • scanning electron microscope (SEM) beam measurements
  • nanoscale materials
  • device research
• Production Testing of:
  • Laser diode modules
  • Chip on submount laser diodes
  • LEDs
  • Passive optical components
  • Laser diode bars
  • Fiber alignment
• ±100V source for bias requirements
• Measure photodetector current from 1fA to 20mA
• 1fA current measurement resolution
• Measure optical power directly when used with Model 2500INT Integrating Sphere
• Includes an analog output jack on the rear panel for each channel
• 0–10V analog output for high resolution optical power feedback
• Provides a high accuracy, high speed fiber alignment solution
• Supports assembly process, final testing, parts binning, and specification
• Allows faster alignment of the fiber with the laser diode’s optimum light emitting region
• Combines fiber alignment and device characterization processes
• User-programmable photodetector calibration coefficients
• 3000-point buffer memory on each channel allows data transfer after test completion
• Digital I/O and Trigger Link for binning and sweep test operations
• IEEE-488 and RS-232 interfaces